Digital IC Tester

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Product Details:

Humidity 85% RH (Non-condensing)
Interface Type IC Socket (DIP)
Test Range Various Logic Family ICs (TTL, CMOS, etc.)
Features LED Indicator, Push-button Control, Multi-family support
Number of Specimens Single IC at a time
Temperature 0C - 40C Operating
Display Type LED Status Display
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Digital IC Tester Price And Quantity

Minimum Order Quantity 1 Unit

Digital IC Tester Product Specifications

Application Testing digital integrated circuits
Automation Grade Manual
Mounting Type Bench-top
Machine Weight Approx 1.3 kg
Number of Specimens Single IC at a time
Temperature 0C - 40C Operating
Display Type LED Status Display
Capacity Multi-family compatibility
Interface Type IC Socket (DIP)
Control Mode Push-button / Switch Control
Usage IC Quality and Logic Test
Test Range Various Logic Family ICs (TTL, CMOS, etc.)
Features LED Indicator, Push-button Control, Multi-family support
Humidity 85% RH (Non-condensing)
Equipment Type Digital IC Tester
Response Time Instant / Real-time
Port Size Standard IC Socket Interface
Resolution Pin-level
Test Speed Manual / Instant
Test Width Standard 24-pin
Frequency 50Hz
Specimen Size DIP ICs up to 24 pins
Accuracy High (depends on IC family & type)
Power Supply 230V AC, 50Hz / 9V DC Battery
Measuring Range Standard logic functions
Operating Voltage 9V DC/230V AC

Body Material Durable ABS plastic housing
Operating Mode Self-test & Manual test modes
Dimensions Approx 220mm x 120mm x 55mm
Power Consumption Low Power (<5W)
Supported IC Types TTL, CMOS, 74 series, 40/45 series
Connectivity No PC interface required
IC Socket Type Zero insertion force (ZIF)
Accessories Included User Guide, Power Cord (for AC version)
Safety Compliance Basic short-circuit protection
Indication Method LED Pass/Fail & Pin Status indication

Digital IC Tester Trade Information

Supply Ability 5 Unit Per Week
Delivery Time 4-5 Days
Main Domestic Market All India

Product Description

Digital IC Tester (Portable)
FEATURES

It has 12/16/24 keys for its operation.
Tests most of the 6 to 40 pin ICs in DIP package. The list includes 74/54, 40/45, 93/96 series ICs, EPROMs, RAMs, peripheral ICs, microprocessor (8088/8085/Z80/6502), miscellaneous digital ICs.
Automatic testing of variety of ICs.
Potential free 40 pin universal ZIF socket.
Six Seven Segment Display to show IC number, PASS & FAIL Status, Operations display.
Audio alarm to user whenever it is required.
Portable size
Mains operation

TEST LIBRARY

Timers
LM555 NE555 HA17555

A to D Converters
ADC0801 ADC0802 ADC0803 ADC0804

D to A Converters
DAC0800 DAC0806 DAC0807 DAC0808 HA17008R HA17408

General Analog ICs
75182 75183 75189 DS7820A DS8820A DS8830 Mc1489

Voltage Followers

LM102 LM202 LM302 LM110(14 pin) LM210(14 pin) LM310(8/14 pin) LM2110 LM2210 LM2310

Analog Switches/Cross Point Switches & Multiplexers
CD4016 CD4066 CD4051 CD4052 CD4053 HI200 HI201 HI300 HI301 HI302 HI303 HI304 HI305 HI306 HI307 CD22100

Test Library is same as of DICTH.
TIL114 TIL115 TIL116 TIL117 TIL118 TIL119 TIL127 TIL128 TIL153 TIL154 TIL155 TIL156 TIL157 TIL181 TIL189 TIL190 MOC3009 MOC3010 MOC3011 MOC3012 MOC3020 MOC3021 MOC3022 MOC3023 HCPL2502 HCPL2601 HCPL2630 OPI8012 OPI8013 OPI8014 OPI8015

Effortless Logic IC Testing

Test your digital integrated circuits quickly and efficiently with the Digital IC Tester. Its ZIF socket ensures effortless installation and removal of ICs, reducing the risk of pin damage. Instant LED indicators provide clear feedback on pass/fail status and individual pin conditions, streamlining your testing process. Designed for use in diverse Indian environments, this tester delivers reliable results for a wide array of logic family ICs.

Wide Compatibility and Safe Operation

Experience seamless compatibility across major IC families, including TTL, CMOS, and standard logic series. The tester incorporates basic short-circuit protection and is encased in durable ABS material, safeguarding your equipment and components during everyday use. Its low power consumption and dual-mode power supply (AC and battery) ensure flexibility and safety in both lab and field settings.

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