Resistivity Of Semiconductors by four probe method

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Product Details:

Power Electronic power supply, 0-200 mA, variable
Usage To determine resistivity and energy gap of semiconductors
Voltage 0-2V DC variable output
Display Digital display for current and voltage readings
Product Type Physics Lab Experiment Apparatus
Material Stainless steel probes, powder-coated mild steel body
Design Portable benchtop unit with attached four probe assembly
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Resistivity Of Semiconductors by four probe method Price And Quantity

Minimum Order Quantity 1 Unit

Sample Holder Low-resistance bakelite mounted on heat sink
Sample Type Compatible with Ge, Si, and other semiconductor wafers
Voltage Resolution 0.1 mV
Current Resolution 0.01 mA
Measurement Range Suitable for resistivity measurements from 10 to 10 -cm
Heater Built-in, with regulated heating system
Control Independent controls for current and voltage setting
Package Contains Main four probe unit, power cord, semiconductor sample, manual
Safety Overcurrent and overheat protection circuit
Probe Spacing 2 mm fixed, accurately aligned
Operating Environment 0C to 50C, non-condensing
Data Output Direct digital reading of voltage, current, and temperature
Temperature Measurement Digital thermometer with sensor, range 0C to 150C

Resistivity Of Semiconductors by four probe method Product Specifications

Power Source 230V AC mains
Display Digital display for current and voltage readings
Detector Four probe arrangement with spring-loaded contacts
Material Stainless steel probes, powder-coated mild steel body
Power Electronic power supply, 0-200 mA, variable
Usage To determine resistivity and energy gap of semiconductors
Weight Approx. 2.2 kg
Product Type Physics Lab Experiment Apparatus
Voltage 0-2V DC variable output
Design Portable benchtop unit with attached four probe assembly
Accuracy 1% of reading
Dimension (L*W*H) 220 mm x 100 mm x 80 mm (approx)

Sample Holder Low-resistance bakelite mounted on heat sink
Sample Type Compatible with Ge, Si, and other semiconductor wafers
Voltage Resolution 0.1 mV
Current Resolution 0.01 mA
Measurement Range Suitable for resistivity measurements from 10 to 10 -cm
Heater Built-in, with regulated heating system
Control Independent controls for current and voltage setting
Package Contains Main four probe unit, power cord, semiconductor sample, manual
Safety Overcurrent and overheat protection circuit
Probe Spacing 2 mm fixed, accurately aligned
Operating Environment 0C to 50C, non-condensing
Data Output Direct digital reading of voltage, current, and temperature
Temperature Measurement Digital thermometer with sensor, range 0C to 150C

Resistivity Of Semiconductors by four probe method Trade Information

Supply Ability 5 Unit Per Week
Delivery Time 4-5 Days
Main Export Market(s) Australia, South America, Eastern Europe, Africa, Asia
Main Domestic Market All India

Product Description

Resistivity of semiconductors by four probe method at different Temperatures Determination of Band gap

The experiment consists of the following

Four Probe Arrangement
Oven upto 200 C
Sample Ge Crystal mounted
Thermometer 0 200 C
Four Probe Setup

Constant Current power supply digital Accuracy : 0.25 of the reading 1 digit Load Regulation : 0.03 for no load to full load

Electronic Millivoltmeter 200 mV Accuracy 0.1 of reading 1 digit Impedence 1 Mohm

Display 3 digit 7 segment LED 12.5mm height with auto polarity and decimal indication.

Specification

Usage Application	Laboratory
Material	Metal
Color	gray
Type	Digital
Display Type	digital
Power	AC Mains
Power Supply	ac mains
Model Name/Number	AE 220

Advanced Measurement Accuracy

Boasting 1% accuracy of reading, this four probe unit is optimized for precise resistivity measurements ranging from 10 to 10 -cm. The combination of stainless steel probes and a bakelite sample holder minimizes contact resistance, ensuring high fidelity results for assessing semiconductor properties.

User-friendly Digital Interface

With independent controls for current and voltage, and clear digital displays for all parameters, users can seamlessly set up, monitor, and log measurements. The intuitive controls, along with direct digital reading of voltage, current, and temperature, foster both ease and efficiency for researchers and instructors alike.

Versatile and Safe Operation

Compatible with a variety of semiconductor wafers including Ge and Si, the portable benchtop unit features robust safety protections against overcurrent and overheating. It operates reliably within an ambient temperature range of 0C to 50C, making it suitable for multiple laboratory environments across India and abroad.

FAQs of Resistivity Of Semiconductors by four probe method:

Q: How does the four probe method improve resistivity measurements in semiconductors?

A: The four probe configuration minimizes the error typically caused by contact resistance, allowing for more accurate determination of a semiconductors resistivity by ensuring the voltage drop across the sample is measured independently of the current supply contacts.

Q: What types of semiconductor samples are compatible with this system?

A: This instrument is designed for use with germanium (Ge), silicon (Si), and other standard semiconductor wafers. The spring-loaded, stainless steel probes ensure secure contact with a range of wafer materials and sizes.

Q: When is the built-in heating system utilized during measurements?

A: The integrated heater with regulated heating is used when studying the temperature dependence of resistivity or determining the semiconductors energy gap. It allows precise temperature control from 0C to 150C, monitored via a digital thermometer.

Q: Where should I operate the four probe resistivity unit for optimal performance?

A: For best results, use the benchtop unit in a non-condensing, indoor environment with ambient temperatures between 0C and 50C. This ensures reliable operation and protects sensitive electronic components.

Q: What is the process for setting up and conducting a measurement?

A: Place the sample on the bakelite holder, align the probes, set desired current and voltage using the independent controls, and monitor readings directly from the digital display. Adjust the temperature as required and use the safety features to prevent overheating or overcurrent faults.

Q: How does direct digital output benefit users?

A: Direct digital readings of current, voltage, and temperature eliminate manual error, streamline data collection, and enhance the overall efficiency and accuracy of resistivity and energy gap experiments.

Q: What safety features are included in this four probe unit?

A: The system includes built-in circuits to protect against overcurrent and overheating, safeguarding both the sample and operator while ensuring consistent and safe operation throughout each use.

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