Resistivity Of Semiconductors by four probe method

Product Description

Resistivity of semiconductors by four probe method at different Temperatures  Determination of Band gap

The experiment consists of the following 

• Four Probe Arrangement 
• Oven upto 200 C
• Sample  Ge Crystal mounted 
• Thermometer 0 200 C
• Four Probe Setup 

 Constant Current power supply digital Accuracy : 0.25 of the reading 1 digit Load Regulation : 0.03 for no load to full load 

Electronic Millivoltmeter 200 mV Accuracy   0.1 of reading  1 digit Impedence  1 Mohm 

Display  3 digit 7 segment LED 12.5mm height with auto polarity and decimal indication.

Specification

Usage Application	Laboratory
Material	Metal
Color	gray
Type	Digital
Display Type	digital
Power	AC Mains
Power Supply	ac mains
Model Name/Number	AE 220

 

Advanced Measurement Accuracy

Boasting 1% accuracy of reading, this four probe unit is optimized for precise resistivity measurements ranging from 10 to 10 -cm. The combination of stainless steel probes and a bakelite sample holder minimizes contact resistance, ensuring high fidelity results for assessing semiconductor properties.


User-friendly Digital Interface

With independent controls for current and voltage, and clear digital displays for all parameters, users can seamlessly set up, monitor, and log measurements. The intuitive controls, along with direct digital reading of voltage, current, and temperature, foster both ease and efficiency for researchers and instructors alike.


Versatile and Safe Operation

Compatible with a variety of semiconductor wafers including Ge and Si, the portable benchtop unit features robust safety protections against overcurrent and overheating. It operates reliably within an ambient temperature range of 0C to 50C, making it suitable for multiple laboratory environments across India and abroad.